In situ thickness control of black phosphorus field-effect transistors via ozone treatment
Crossref DOI link: https://doi.org/10.1007/s12274-016-1188-5
Published Online: 2016-08-25
Published Print: 2016-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Suhyun
Jung, Younghun
Lee, Jong-Young
Lee, Gwan-Hyoung
Kim, Jihyun
License valid from 2016-08-25