Effect of carrier screening on ZnO-based resistive switching memory devices
Crossref DOI link: https://doi.org/10.1007/s12274-016-1267-7
Published Online: 2016-10-20
Published Print: 2017-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Sun, Yihui
Yan, Xiaoqin
Zheng, Xin
Li, Yong
Liu, Yichong
Shen, Yanwei
Ding, Yi
Zhang, Yue
License valid from 2016-10-20