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Sub-micrometer-scale chemical analysis by nanosecond-laser-induced tip-enhanced ablation and ionization time-of-flight mass spectrometry

Crossref DOI link: https://doi.org/10.1007/s12274-018-2113-x

Published Online: 2018-06-20

Published Print: 2018-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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