E-beam manipulation of Si atoms on graphene edges with an aberration-corrected scanning transmission electron microscope
Crossref DOI link: https://doi.org/10.1007/s12274-018-2141-6
Published Online: 2018-07-14
Published Print: 2018-12
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dyck, Ondrej
Kim, Songkil
Kalinin, Sergei V.
Jesse, Stephen
Text and Data Mining valid from 2018-07-14
Article History
Received: 19 April 2018
Revised: 31 May 2018
Accepted: 30 June 2018
First Online: 14 July 2018