Quasi-two-dimensional β-Ga2O3 field effect transistors with large drain current density and low contact resistance via controlled formation of interfacial oxygen vacancies
Crossref DOI link: https://doi.org/10.1007/s12274-018-2193-7
Published Online: 2018-09-22
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Li, Zhen
Liu, Yihang
Zhang, Anyi
Liu, Qingzhou
Shen, Chenfei
Wu, Fanqi
Xu, Chi
Chen, Mingrui
Fu, Hongyu
Zhou, Chongwu
Text and Data Mining valid from 2018-09-22
Article History
Received: 3 June 2018
Revised: 31 August 2018
Accepted: 5 September 2018
First Online: 22 September 2018