In-plane grain boundary induced defect state in hierarchical NiCo-LDH and effect on battery-type charge storage
Crossref DOI link: https://doi.org/10.1007/s12274-022-4485-1
Published Online: 2022-06-27
Published Print: 2023-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ban, Jinjin
Wen, Xiaohan
Lei, Honghong
Cao, Guoqin
Liu, Xinhong
Niu, Chunyao
Shao, Guosheng
Hu, Junhua
Text and Data Mining valid from 2022-06-27
Version of Record valid from 2022-06-27
Article History
Received: 25 January 2022
Revised: 20 March 2022
Accepted: 1 May 2022
First Online: 27 June 2022