Van der Waals integration inch-scale 2D MoSe2 layers on Si for highly-sensitive broadband photodetection and imaging
Crossref DOI link: https://doi.org/10.1007/s12274-023-5759-y
Published Online: 2023-06-08
Published Print: 2023-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Wu, Yupiao
Wu, Shuo-En
Hei, Jinjin
Zeng, Longhui
Lin, Pei
Shi, Zhifeng
Chen, Qingming
Li, Xinjian
Yu, Xuechao
Wu, Di
Text and Data Mining valid from 2023-06-08
Version of Record valid from 2023-06-08
Article History
Received: 8 March 2023
Revised: 11 April 2023
Accepted: 19 April 2023
First Online: 8 June 2023