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Accurate atomic scanning transmission electron microscopy analysis enabled by deep learning

Published Online: 2023-09-23

Published Print: 2024-04

Authors

Chu, Tianshu

Zhou, Lei

Zhang, Bowei

Xuan, Fu-Zhen
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Text and Data Mining valid from 2023-09-23

Version of Record valid from 2023-09-23
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Article History

Received: 11 July 2023

Revised: 14 August 2023

Accepted: 16 August 2023

First Online: 23 September 2023

Document is current