A (not so) dangerous method: pXRF vs. EPMA-WDS analyses of copper-based artefacts
Crossref DOI link: https://doi.org/10.1007/s12520-014-0198-z
Published Online: 2014-06-13
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Orfanou, V.
Rehren, Th.
License valid from 2014-06-13
