Li, Xiutong
Liu, Ruixin
Li, Yuxin
Li, Zhilin
Yan, Peng
Yu, Mei
Dong, Xuan
Yan, Jianwei
Xie, Benliang
Funding for this research was provided by:
National Key Research and Development Program (2016YFD0201305-07)
Guizhou Provincial Basic Research Program (ZK[2023]060)
Open Fund Project in Semiconductor Power Device Reliability Engineering Center of Ministry of Education (ERCMEKFJJ2019-06)
Article History
Received: 13 November 2023
Accepted: 19 April 2024
First Online: 8 May 2024
Declarations
:
: The authors declared no potential conflict of interest with respect to the research, author-ship, or publication of this article.