High-speed double-slit interferometer using a position sensitive detector for in-line thickness variation measurement of glass panels
Crossref DOI link: https://doi.org/10.1007/s12541-015-0254-3
Published Online: 2015-08-04
Published Print: 2015-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Jong-Ahn
Kim, Jae Wan
Kang, Chu-Shik
Jin, Jonghan
Eom, Tae Bong
Text and Data Mining valid from 2015-08-01