Characterization of atomic layer deposited and sputtered yttria-stabilized-zirconia thin films for low-temperature solid oxide fuel cells
Crossref DOI link: https://doi.org/10.1007/s12541-015-0287-7
Published Online: 2015-08-29
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Tanveer, Waqas Hassan
Ji, Sanghoon
Yu, Wonjong
Cha, Suk Won
Text and Data Mining valid from 2015-08-29