Fatigue life estimation of vertical probe needle for wafer probing
Crossref DOI link: https://doi.org/10.1007/s12541-015-0322-8
Published Online: 2015-11-07
Published Print: 2015-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Shin, Bonghun
Kwon, Hyock-Ju
Han, Sang-Wook
Im, Chang Min
Text and Data Mining valid from 2015-11-01