Crossmark

Study on the Influence of Variation of Contact Arc Zone on the Single-Pass Sawing of Sapphire Wafer

Crossref DOI link: https://doi.org/10.1007/s12541-018-0150-8

Published Online: 2018-09-14

Published Print: 2018-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Shen, Jianyun https://orcid.org/0000-0002-0755-3340
Lu, Lang

Gong, Yuanyuan

Xu, Xipeng
License Information

Text and Data Mining valid from 2018-09-01
More Information

Article History

Received: 16 June 2017

Revised: 23 October 2017

Accepted: 14 June 2018

First Online: 14 September 2018