On-Machine Self-calibration of a Two-Dimensional Stage Using an Absolute X–Y–Θ Position Sensor
Crossref DOI link: https://doi.org/10.1007/s12541-020-00365-1
Published Online: 2020-06-03
Published Print: 2020-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kim, Jong-Ahn https://orcid.org/0000-0001-5114-4272
Kim, Jae Wan
Kang, Chu-Shik
Lee, Jae Yong
Funding for this research was provided by:
Korea Research Institute of Standards and Science (GP2019-0005-01)
Text and Data Mining valid from 2020-06-03
Version of Record valid from 2020-06-03
Article History
Received: 11 October 2019
Revised: 19 May 2020
Accepted: 21 May 2020
First Online: 3 June 2020