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Unsupervised Manufacturing Fault Detection Based on Self-labeled Training of Fingerprint Image Constructed from Time-Series Data

Published Online: 2024-02-01

Published Print: 2024-04

Authors

Seo, Jaedeok

Kim, Wonjung

Lee, Jeongsu https://orcid.org/0000-0002-7518-7020
Funding

Funding for this research was provided by:

Ministry of Science and ICT (2021R1A2C2011279)

Ministry of Science and ICT, South Korea (RS-2023-00279929)
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Text and Data Mining valid from 2024-02-01

Version of Record valid from 2024-02-01
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Article History

Received: 27 June 2022

Revised: 13 October 2023

Accepted: 14 December 2023

First Online: 1 February 2024

Declarations

:

: The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

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