A parameter estimation approach based on binary measurements using Maximum Likelihood analysis - Application to MEMS
Crossref DOI link: https://doi.org/10.1007/s12555-015-0343-1
Published Online: 2017-03-08
Published Print: 2017-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jafari, Kian
License valid from 2017-03-08
