An Advanced Image Processing Technique for Backscatter-Electron Data by Scanning Electron Microscopy for Microscale Rock Exploration
Crossref DOI link: https://doi.org/10.1007/s12583-024-1969-9
Published Online: 2024-02-14
Published Print: 2024-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Hou, Zhaoliang
Qiu, Kunfeng https://orcid.org/0000-0002-3185-9446
Zhou, Tong
Cai, Yiwei
Text and Data Mining valid from 2024-02-01
Version of Record valid from 2024-02-01
Article History
Received: 16 December 2023
Accepted: 29 December 2023
First Online: 14 February 2024
Conflict of Interest
: The authors declare that they have no conflict of interest.