Static laser surface authentication with low-cost microscope: Tolerances on spatial and angular disturbance
Crossref DOI link: https://doi.org/10.1007/s12596-015-0250-0
Published Online: 2015-05-17
Published Print: 2015-09
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Samsul, W.
Uranus, H. P.
Birowosuto, M. D. http://orcid.org/0000-0002-9997-6841
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