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Investigation of cerium oxide thin film thickness using THz spectroscopy for non-destructive measurement

Published Online: 2020-11-21

Published Print: 2021-03

Authors

Nimanpure, Subhash

Singh, Guruvandra

Yadav, Sudha

Singh, Preetam

Moona, Girija

Jewariya, Mukesh

Sharma, Rina
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Text and Data Mining valid from 2020-11-21

Version of Record valid from 2020-11-21
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Article History

Received: 18 June 2020

Accepted: 30 October 2020

First Online: 21 November 2020

Document is current