Crossmark

Semiconductor performance of rare earth gadolinium‐doped aluminum–zinc oxide thin film

Crossref DOI link: https://doi.org/10.1007/s12598-015-0469-6

Published Online: 2015-03-25

Published Print: 2016-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Dong, Jun‐Chen

Han, De‐Dong

Zhao, Fei‐Long

Zhao, Nan‐Nan

Wu, Jing

Liu, Li‐Feng

Kang, Jin‐Feng

Wang, Yi
Funding

Funding for this research was provided by:

National Key Research and Development Program of China (2011CBA00600)

National Natural Science Foundation of China (61275025)
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Text and Data Mining valid from 2015-03-25

Text and Data Mining valid from 2015-03-25