Deposition of TiN/TiAlN multilayers by plasma-activated EB-PVD: tailored microstructure by jumping beam technology
Crossref DOI link: https://doi.org/10.1007/s12598-016-0824-2
Published Online: 2016-12-20
Published Print: 2017-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Yang, Guo-Yuan
Peng, Hui https://orcid.org/0000-0002-7336-5700
Guo, Hong-Bo
Gong, Sheng-Kai
Funding for this research was provided by:
Nature Science Foundations of China (NFSC) (51201005, 51231001)
License valid from 2016-12-20