Crossmark

Dielectric and energy storage properties of PbO–SrO–Nb <sub>2</sub> O <sub>5</sub> –Na <sub>2</sub> O–Si thin films by annealing

Crossref DOI link: https://doi.org/10.1007/s12598-018-1134-7

Published Online: 2018-10-11

Published Print: 2024-01

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Tan, Fei‐Hu https://orcid.org/0000-0002-5407-5839
Zhang, Qing‐Meng

Wei, Feng

Zhao, Hong‐Bin

Zhang, Xiao

Du, Jun https://orcid.org/0000-0002-8960-3777
Funding

Funding for this research was provided by:

Youth Science Fund Project (51477012)

Beijing Nova Program (xx2016046)

National Natural Science Foundation of China (51477012)

Beijing Nova Program (xx2016046)
License Information

Version of Record valid from 2018-10-11

Text and Data Mining valid from 2018-10-11

Version of Record valid from 2018-10-11
More Information

Article History

Received: 26 September 2017

Revised: 16 January 2018

Accepted: 6 August 2018

First Online: 11 October 2018