Post‐deposition‐annealed lanthanum‐doped cerium oxide thin films: structural and electrical properties
Crossref DOI link: https://doi.org/10.1007/s12598-020-01380-x
Published Online: 2020-04-04
Published Print: 2021-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Barhate, Viral Nivritti
Agrawal, Khushabu Santosh
Patil, Vilas Sidhhanath
Mahajan, Ashok Mahadu https://orcid.org/0000-0003-4212-299X
Version of Record valid from 2020-04-04
Text and Data Mining valid from 2020-04-04
Article History
Received: 8 March 2019
Revised: 24 May 2019
Accepted: 19 February 2020
First Online: 4 April 2020