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Reducing structural degradation of high‐voltage single‐crystal Ni‐rich cathode through in situ doping strategy

Crossref DOI link: https://doi.org/10.1007/s12598-023-02288-y

Published Online: 2023-07-14

Published Print: 2023-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Fan, Xin‐Ming

Zhang, Zhi https://orcid.org/0000-0003-4079-4434
Mao, Gao‐Qiang

Tong, Ying‐Jie

Lin, Ke‐Bo

Tong, Hui https://orcid.org/0000-0003-4311-8247
Wei, Wei‐Feng

Tian, Qing‐Hua

Guo, Xue‐Yi https://orcid.org/0000-0003-0660-3024
Funding

Funding for this research was provided by:

the China Postdoctoral Science Foundation (2022M713547)

the Natural Science Foundation of Hunan Province (2022JJ40595)
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Text and Data Mining valid from 2023-07-14

Text and Data Mining valid from 2023-07-14

Version of Record valid from 2023-07-14
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Article History

Received: 24 July 2022

Revised: 17 August 2022

Accepted: 29 August 2022

First Online: 14 July 2023

Declarations

:

: The authors declare that they have no conflict of interest.