In situ backscattered electron imaging study of the effect of annealing on the deformation behaviors of Ni electroformed from additive-free and saccharin-containing sulfamate solutions
Crossref DOI link: https://doi.org/10.1007/s12613-019-1715-y
Published Online: 2019-01-05
Published Print: 2019-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Jiang, Kai
Nakano, Hiroaki
Oue, Satoshi
Morikawa, Tatsuya
Tian, Wen-huai
Text and Data Mining valid from 2019-01-01
Article History
Received: 27 April 2018
Revised: 23 August 2018
Accepted: 16 October 2018
First Online: 5 January 2019