Neutral and metallic vs. charged and semiconducting surface layer in acceptor doped CeO2
Crossref DOI link: https://doi.org/10.1007/s12613-023-2789-0
Published Online: 2024-04-16
Published Print: 2024-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Riess, Ilan
Text and Data Mining valid from 2024-04-01
Version of Record valid from 2024-04-01
Article History
Received: 27 June 2023
Revised: 19 October 2023
Accepted: 17 November 2023
First Online: 16 April 2024
Conflict of Interest
: The authors declare no conflict of interest.