Influence of Annealing Temperature on Structural and dc Electrical Properties of SnO2 Thin Films for Schottky Barrier Diodes
Crossref DOI link: https://doi.org/10.1007/s12633-017-9643-9
Published Online: 2018-01-06
Published Print: 2018-07
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Ravikumar, K.
Agilan, S.
Muthukumarasamy, N.
Raja, M.
Lakshmanan, Raja
Ganesh, R.
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