Frequency and Voltage Dependence of Interface States and Series Resistance in Ti/Au/p-Si Diodes with 100 μm and 200 μm Diameter Fabricated by Photolithography
Crossref DOI link: https://doi.org/10.1007/s12633-017-9734-7
Published Online: 2018-06-20
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Korucu, D.
Duman, S.
Text and Data Mining valid from 2018-06-20
Article History
Received: 21 July 2016
Accepted: 15 December 2017
First Online: 20 June 2018