High Frequency Analysis and Small-Signal Modeling of AlGaN/GaN HEMTs with SiO2/SiN Passivation
Crossref DOI link: https://doi.org/10.1007/s12633-018-9767-6
Published Online: 2018-06-02
Published Print: 2019-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Gassoumi, Moujahed
Helali, Abdelhamid
Gassoumi, Malek
Gaquiere, Christophe
Maaref, Hassen
Text and Data Mining valid from 2018-06-02
Article History
Received: 30 December 2016
Accepted: 11 January 2018
First Online: 2 June 2018