A Study on the Electronic Properties of SiOxNy/p-Si Interface
Crossref DOI link: https://doi.org/10.1007/s12633-018-9811-6
Published Online: 2018-04-12
Published Print: 2018-11
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Akkaya, A. http://orcid.org/0000-0002-4086-6365
Boyarbay, B.
Çetin, H.
Yıldızlı, K.
Ayyıldız, E.
Funding for this research was provided by:
Erciyes Üniversitesi (FBA-09-1073)
Text and Data Mining valid from 2018-04-12
Article History
Received: 28 July 2017
Accepted: 16 March 2018
First Online: 12 April 2018