Photoluminescence Study of Deep Level Defects in ZnO Thin Films
Crossref DOI link: https://doi.org/10.1007/s12633-018-9876-2
Published Online: 2018-05-07
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kabir, A.
Bouanane, I.
Boulainine, D.
Zerkout, S.
Schmerber, G.
Boudjema, B.
Text and Data Mining valid from 2018-05-07
Article History
Received: 14 December 2017
Accepted: 18 April 2018
First Online: 7 May 2018