TFET on Selective Buried Oxide (SELBOX) Substrate with Improved ION/IOFF Ratio and Reduced Ambipolar Current
Crossref DOI link: https://doi.org/10.1007/s12633-018-9894-0
Published Online: 2018-05-23
Published Print: 2019-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Barah, Dhruvajyoti http://orcid.org/0000-0002-9515-1666
Singh, Ashish Kumar
Bhowmick, Brinda
Text and Data Mining valid from 2018-05-23
Article History
Received: 27 December 2016
Accepted: 7 May 2018
First Online: 23 May 2018