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Exploring the Threshold Voltage Characteristics and Short Channel Behavior of Gate Engineered Front Gate Stack MOSFET with Graded Channel

Crossref DOI link: https://doi.org/10.1007/s12633-018-9950-9

Published Online: 2018-08-02

Published Print: 2019-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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