Crystallization of P Type Amorphous Silicon (a-Si: H) by AIC Method: Effect of Aluminum Thickness
Crossref DOI link: https://doi.org/10.1007/s12633-019-00129-1
Published Online: 2019-04-02
Published Print: 2020-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Kezzoula, Faouzi
Kechouane, Mohamed
Mohammed-Brahim, Tayeb
Menari, Hamid
Funding for this research was provided by:
DGRSDT-ALGERIA (/)
Text and Data Mining valid from 2019-04-02
Article History
Received: 25 November 2018
Accepted: 5 March 2019
First Online: 2 April 2019