Influence of Low-Temperature Annealing on the Electrical Conductivity of SiOx Films
Crossref DOI link: https://doi.org/10.1007/s12633-019-00149-x
Published Online: 2019-04-02
Published Print: 2020-02
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Pylypova, O. V. http://orcid.org/0000-0002-0337-4724
Evtukh, A. A.
Skryshevsky, V. A.
Bratus, O. L.
Text and Data Mining valid from 2019-04-02
Article History
Received: 17 January 2019
Accepted: 25 March 2019
First Online: 2 April 2019