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A Comparative Study on Scaling Capabilities of Si and SiGe Nanoscale Double Gate Tunneling FETs

Crossref DOI link: https://doi.org/10.1007/s12633-019-00190-w

Published Online: 2019-06-04

Published Print: 2020-04

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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