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Process Variation Study of SELBOX Inverted- T Junctionless FinFET for High-Performance Applications

Crossref DOI link: https://doi.org/10.1007/s12633-019-00270-x

Published Online: 2019-10-10

Published Print: 2020-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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