Frequency and Voltage Dependence of the Dielectric Properties of Ni/SiO2/P-Si (MOS) Structure
Crossref DOI link: https://doi.org/10.1007/s12633-019-00277-4
Published Online: 2019-11-14
Published Print: 2020-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Mahani, Ragab http://orcid.org/0000-0002-8856-6302
Ashery, A.
Elnasharty, Mohamed M. M.
Text and Data Mining valid from 2019-11-14
Version of Record valid from 2019-11-14
Article History
Received: 14 February 2019
Accepted: 24 September 2019
First Online: 14 November 2019