Experimental Investigation of White Layer Thickness on EDM Processed Silicon Steel Using ANFIS Approach
Crossref DOI link: https://doi.org/10.1007/s12633-019-00287-2
Published Online: 2019-11-21
Published Print: 2020-08
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Muthuramalingam, T. http://orcid.org/0000-0001-5487-545X
Saravanakumar, D.
Babu, L. Ganesh
Huu Phan, Nguyen
Pi, Vu Ngoc
Text and Data Mining valid from 2019-11-21
Version of Record valid from 2019-11-21
Article History
Received: 28 April 2019
Accepted: 25 September 2019
First Online: 21 November 2019