Enhancement of Performance in TFET by Reducing High-K Dielectric Length and Drain Electrode Thickness
Crossref DOI link: https://doi.org/10.1007/s12633-019-00328-w
Published Online: 2019-12-03
Published Print: 2020-10
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Rani, C. Sheeja Herobin
Bagan, K. Bhoopathy
Nirmal, D.
Roach, R. Solomon
Text and Data Mining valid from 2019-12-03
Version of Record valid from 2019-12-03
Article History
Received: 23 July 2019
Accepted: 13 November 2019
First Online: 3 December 2019