Unified Quantum and Reliability Model for Ultra-Thin Double-Gate MOSFETs
Crossref DOI link: https://doi.org/10.1007/s12633-019-0096-1
Published Online: 2019-02-06
Published Print: 2020-01
Update policy: https://doi.org/10.1007/springer_crossmark_policy
ElKashlan, Rana Y.
Samy, Omnia
Anis, Azza
Ismail, Yehea
Abdelhamid, Hamdy
Text and Data Mining valid from 2019-02-06
Article History
Received: 8 August 2018
Accepted: 29 January 2019
First Online: 6 February 2019