Impact of Left Side Back Gate Misalignment Effect in an Analytical Tunneling Current Modeling of an Ultrathin Asymmetric DG TFET
Crossref DOI link: https://doi.org/10.1007/s12633-020-00431-3
Published Online: 2020-08-14
Published Print: 2021-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Dutta, Pradipta
Text and Data Mining valid from 2020-08-14
Version of Record valid from 2020-08-14
Article History
Received: 27 September 2019
Accepted: 24 February 2020
First Online: 14 August 2020