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Center Potential Based Analysis of Si and III-V Gate all around Field Effect Transistors (GAA-FETs)

Crossref DOI link: https://doi.org/10.1007/s12633-020-00559-2

Published Online: 2020-07-06

Published Print: 2021-06

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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