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Analysis of Temperature Effect in Quadruple Gate Nano-scale FinFET

Crossref DOI link: https://doi.org/10.1007/s12633-020-00615-x

Published Online: 2020-08-01

Published Print: 2021-07

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Toan, Ho Le Minh

Singh, Sruti Suvadarsini

Maity, Subir Kumar https://orcid.org/0000-0002-8825-996X
License Information

Text and Data Mining valid from 2020-08-01

Version of Record valid from 2020-08-01
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Article History

Received: 2 January 2020

Accepted: 21 July 2020

First Online: 1 August 2020