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Investigation of Temperature Variation and Interface Trap Charges in Dual MOSCAP TFET

Crossref DOI link: https://doi.org/10.1007/s12633-020-00651-7

Published Online: 2020-08-17

Published Print: 2021-09

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Wangkheirakpam, Vandana Devi https://orcid.org/0000-0002-1104-993X
Bhowmick, Brinda

Pukhrambam, Puspa Devi
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Text and Data Mining valid from 2020-08-17

Version of Record valid from 2020-08-17
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Article History

Received: 13 May 2020

Accepted: 11 August 2020

First Online: 17 August 2020