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Low Frequency Noise Analysis of Single Gate Extended Source Tunnel FET

Crossref DOI link: https://doi.org/10.1007/s12633-020-00712-x

Published Online: 2020-09-16

Published Print: 2021-11

Update policy: https://doi.org/10.1007/springer_crossmark_policy

Authors

Talukdar, Jagritee http://orcid.org/0000-0001-7010-4575
Rawat, Gopal

Singh, Kunal

Mummaneni, Kavicharan
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Text and Data Mining valid from 2020-09-16

Version of Record valid from 2020-09-16
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Article History

Received: 3 July 2020

Accepted: 12 September 2020

First Online: 16 September 2020