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A Novel Approach to Investigate the Impact of Hetero-High-K Gate Stack on SiGe Junctionless Gate-All-Around (JL-GAA) MOSFET

Published Online: 2021-01-06

Published Print: 2022-02

Authors

Gupta, Abhinav https://orcid.org/0000-0002-7531-3728
Rai, Sanjeev

Kumar, Nitish

Sigroha, Deepak

Kishore, Arunabh

Pathak, Varnika

Rahman, Ziya Ur
License Information

Text and Data Mining valid from 2021-01-06

Version of Record valid from 2021-01-06
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Article History

Received: 3 July 2020

Accepted: 20 November 2020

First Online: 6 January 2021

Document is current