Annealing Temperature Effect on Bismuth Induced Crystallization of Hydrogenated Amorphous Silicon Thin Films
Crossref DOI link: https://doi.org/10.1007/s12633-021-01005-7
Published Online: 2021-03-04
Published Print: 2022-04
Update policy: https://doi.org/10.1007/springer_crossmark_policy
Zouini, Meriem https://orcid.org/0000-0002-7611-1212
Ouertani, Rachid
Amlouk, Mosbah
Dimassi, Wissem
Text and Data Mining valid from 2021-03-04
Version of Record valid from 2021-03-04
Article History
Received: 5 October 2020
Accepted: 4 February 2021
First Online: 4 March 2021
Declarations
: Yes
: No