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Study of “Thin Buffer” GaN on SiC HEMT and Effect of Bulk Traps on it

Crossref DOI link: https://doi.org/10.1007/s12633-022-01951-w

Published Online: 2022-05-26

Published Print: 2022-12

Update policy: https://doi.org/10.1007/springer_crossmark_policy

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